A wafer prober is a machine automatic test equipment used to test integrated circuits for electrical testing a set of microscopic contacts or probes called a probe card are held in place whilst the wafer vacuum mounted on a wafer chuck is moved into electrical contact.
Automatic test equipments are for integrated circuit testing.
An ate uses control systems and automated information technology to rapidly perform tests that measure and evaluate a dut.
As most faults on a board arise out of the manufacturing process and usually consist of short circuits open circuits or wrong components this form of testing.
The testing equipment used to detect faults in the operation of electronic devices by creating stimulus signals and capture responses from electronic devices under test is known as electronic test equipment.
Generally the term is applied to equipment that is used in testing integrated circuits and printed circuit boards during the manufacturing process.
In one embodiment of the present invention the automated test equipment system includes an interface board that recreates the native motherboard environment of the device under test.
Automatic test equipment ate refers to any equipment used to perform assembly line type testing of produced items.
When a die or array of dice have been electrically tested the prober moves the wafer to the next die or array and the.
Industries use a fully automated test setup called ate automatic test equipment which comprises of almost all standard test equipments controlled by a central controlling unit.
If any faults are detected then identified faults can be traced an rectified using electronic testing equipment.
An ate can be a simple computer controlled digital multimeter or a complicated system containing dozens of complex.
An application specific automated test equipment system for testing integrated circuit devices is described.
Automatic test equipment or automated test equipment ate is any apparatus that performs tests on a device known as the device under test dut equipment under test eut or unit under test uut using automation to quickly perform measurements and evaluate the test results.
Automatic test equipment performs complex tests on printed circuit boards integrated circuits and other electronic devices.
Ate tests can be both simple and complex depending on the equipment tested.
Testing modern vlsi circuits is a complex affair.
Automatic test equipment ate is a machine that is designed to perform tests on different devices referred to as a devices under test dut.
In circuit test equipment provides a useful and efficient form of printed circuit board test by measuring each component in turn to check that it is in place and of the correct value.
The testing usually takes place in a production environment where automated relatively high speed testing is important.
